Evaluation of Anisotropic Conductive Films Based on Vertical Fibers for Post-CMOS Wafer-Level Packaging

Diop, MamadouDiobet; Radji, Moufid; Hamoui, Anas A.; Blaquiere, Yves et Izquierdo, Ricardo (2013). « Evaluation of Anisotropic Conductive Films Based on Vertical Fibers for Post-CMOS Wafer-Level Packaging ». IEEE Transactions on Components, Packaging and Manufacturing Technology, 3(4), pp. 581-591.

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Résumé

In this paper, we investigate the mechanical and electrical properties of an anisotropic conductive film (ACF) on the basis of high-density vertical fibers for a wafer-level packaging (WLP) application. As part of the WaferBoard, a reconfigurable circuit platform for rapid system prototyping, ACF is used as an intermediate film providing compliant and vertical electrical connection between chip contacts and a top surface of an active wafer-size large-area IC. The chosen ACF is first tested by an indentation technique. The results show that the elastic–plastic deformation mode as well as the Young’s modulus and the hardness depend on the indentation depth. Second, the efficiency of the electrical contact is tested using a uniaxial compression on a stack comprising a dummy ball grid array (BGA) board, an ACF, and a thin Al film. For three bump diameters, as the compression increases, the resistance values decrease before reaching low and stable values. Despite the BGA solder bumps exhibit plastic deformation after compression, no damage is found on the ACF film. These results show that vertical fiber ACFs can be used for nonpermanent bonding in a WLP application.

Type: Article de revue scientifique
Mots-clés ou Sujets: Anisotropic conductive film, contact resistance, elastic-plastic deformation, wafer-level packaging.
Unité d'appartenance: Faculté des sciences > Département d'informatique
Déposé par: Ricardo Izquierdo
Date de dépôt: 29 mars 2016 14:04
Dernière modification: 20 avr. 2016 20:03
Adresse URL : http://archipel.uqam.ca/id/eprint/8039

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